PIXE: A Novel Technique for Elemental Analysis
Sven A.E. Johansson and John L. Campbell
The first comprehensive review of the basic physics, and modern applications, of proton-induced x-ray emission. The physics section and the applications section are relatively independent, making for easy reference. The authors discuss instrument design, and how to handle specimens. They then survey the wide range of applications to which proton-induced x-ray emission has been put. Illustrated.
Thể loại:
Năm:
1988
In lần thứ:
1st Edition
Nhà xuát bản:
John Wiley and Sons Ltd.
Ngôn ngữ:
english
Trang:
361
ISBN 10:
0471920118
ISBN 13:
9780471920113
File:
PDF, 6.00 MB
IPFS:
,
english, 1988
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